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PROJECT TOPIC: NANOCOMPOSIX GUIDELINES FOR TRANSMISSION ELECTRON MICROSCOPY TEM ANALYSIS OF NANO PARTICLES

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Transmission  Electron  Microscopy  (TEM)  is  a  vital  characterization  tool  for  directly  imaging nanomaterials  to  obtain quantitative  measures of particle  and/or  grain  size,  size  distribution, and morphology.   

TEM  images  the  transmission  of  a  focused  beam  of  electrons  through  a  sample,  forming  an image in an analogous way to a  light microscope (Figure 1).  However, because electrons are  used  rather  than  light  to  illuminate  the sample,  TEM  imaging  has  significantly higher  resolution  (by  a  factor  of  about 1000!)  than  light-based  imaging  techniques.    Amplitude  and  phase variations  in  the  transmitted  beam provide  imaging  contrast  that  is  a function  of  the  sample  thickness  (the 

amount  of  material  that  the  electron beam  must  pass  through)  and  the sample  material  (heavier  atoms  scatter more  electrons  and  therefore  have  a smaller  electron  mean  free  path  than lighter atoms).


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